Single Sided Automated Inspection and Metrology for Packaged IC, BGA and Leaded Devices - MVP Aura
MVP’s Aura platform takes in-line package inspection to the next level. Key features include;
- Top side inspection
- Automated in-line tray loading
- Automated part sorting
- Pin/ball Position
- Height, and Coplanarity measurements
Additionally, MVP’s Aura uses the latest advanced 3D high-resolution imaging to provide inspection and measurement capabilities for today’s most demanding devices and packages.
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Key Features
- Dual Technology Inspection - 2D and 3D
- Single-side Inspection
- Full Inspection: Height, Position, Metrology and Coplanarity Measurements
- In-Line JEDEC Tray Handling
- Sorting to Defect Tray
- Interchangeable Vacuum Nozzles for Large and Small Packages
- No Part Size Constraints
- Inspect Parts Independent of Size
- Small Footprint
Capabiliities
- Jedec Tray
- In Line or Same Side In-Out Loader
- SECS/GEM
- XML Map Output for Downstream Sorting
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