MVP Update February 2021 – Focus On Microelectronics – Wire And Die Inspection From MVP
23
Feb
Automated Optical Inspection
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- Microelectronics and Packaging Overview
- Lead Frame Die, Wire and Epoxy AOI
- Post Inspection Defect Marking Options
- Die and Wire Bond AOI
- Packaged IC Inspection and Metrology
- BGA Inspection and Metrology
- Leaded Device Inspection and Metrology
- Sensor Inspection AOI
- Automotive Die and Wire Bond Inspection AOI
- Mil Spec Inspection AOI
- Wafer Inspection AOI
- Dice Wafer Inspection AOI (Film Frame)
- Clean Room AOI
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